International Tables for Crystallography (2006). Vol. B, ch. 4.3, pp. 443-448   | 1 | 2 |
https://doi.org/10.1107/97809553602060000565

Chapter 4.3. Diffuse scattering in electron diffraction

Chapter index

Absorption function 4.3.3
Approximations
phase-object 4.3.3
Born series
expansion 4.3.4
Channelling pattern 4.3.4
Cluster model 4.3.6
Correlation functions 4.3.1
Crystal defects
in thin films 4.3.3
Diffuse scattering 4.3.1
Disorder 4.3.1
substitutional 4.3.6
Dynamical diffraction 4.3.3
Dynamical scattering factor 4.3.4
Electron diffraction 4.3.1
Electron-microscope image contrast 4.3.3
Electron-microscope imaging 4.3.1
Fermi surface 4.3.6
Form factor
Kikuchi-line 4.3.4
Image contrast, electron-microscope 4.3.3
Inelastic scattering 4.3.1
Inner-shell excitations 4.3.2
Kikuchi-line contrast 4.3.4
Kikuchi-line form factor 4.3.4
Microdiffraction 4.3.5, 4.3.6
Multiple diffuse scattering 4.3.4
Multiple scattering 4.3.1
Multislice
calculations 4.3.5
computer programs 4.3.5
Patterson function(s) 4.3.1
Periodic continuation 4.3.5
Phase-object approximation 4.3.3
Phonon scattering 4.3.4
Plasmon scattering 4.3.2
Scattering
diffuse 4.3.1
inelastic 4.3.1
multiple 4.3.1
phonon 4.3.4
plasmon 4.3.2
Scattering factors
dynamical 4.3.4
Short-range order (SRO)
parameters 4.3.1, 4.3.6
SRO (short-range-order)
parameters 4.3.1, 4.3.6
Substitutional disorder 4.3.6
Substitutional order 4.3.4
TDS (thermal diffuse scattering) 4.3.1
Thermal diffuse scattering (TDS) 4.3.1
Thermal streaks 4.3.6
Thin films
crystal defects in 4.3.3
Waller–Hartree formula 4.3.2, 4.3.2, 4.3.4