International Tables for Crystallography (2010). Vol. B, ch. 2.5, pp. 297-402
https://doi.org/10.1107/97809553602060000767 |

## Chapter 2.5. Electron diffraction and electron microscopy in structure determination

## Related articles

Related articles within *International Tables* are as follows:

**Volume A: Space-group symmetry
(first online edition, 2006) **

**Volume B: Reciprocal space
(second online edition, 2010) **

- Chapter 1.2. The structure factor, by P. Coppens
- Chapter 1.3. Fourier transforms in crystallography: theory, algorithms and applications, by G. Bricogne
- Chapter 2.1. Statistical properties of the weighted reciprocal lattice, by U. Shmueli and A. J. C. Wilson
- Chapter 2.2. Direct methods, by C. Giacovazzo
- Chapter 2.3. Patterson and molecular replacement techniques, and the use of noncrystallographic symmetry in phasing, by L. Tong, M. G. Rossmann and E. Arnold
- Chapter 4.3. Diffuse scattering in electron diffraction, by J. M. Cowley and J. K. Gjønnes
- Chapter 5.1. Dynamical theory of X-ray diffraction, by A. Authier
- Chapter 5.2. Dynamical theory of electron diffraction, by A. F. Moodie, J. M. Cowley and P. Goodman

**Volume B: Reciprocal space
(first online edition, 2006) **

**Volume C: Mathematical, physical and chemical tables
(first online edition, 2006) **

- Chapter 4.3. Electron diffraction, by C. Colliex, J. M. Cowley, S. L. Dudarev, M. Fink, J. Gjønnes, R. Hilderbrandt, A. Howie, D. F. Lynch, L. M. Peng, G. Ren, A. W. Ross, V. H. Smith Jr, J. C. H. Spence, J. W. Steeds, J. Wang, M. J. Whelan and B. B. Zvyagin
- Chapter 6.1. Intensity of diffracted intensities, by P. J. Brown, A. G. Fox, E. N. Maslen, M. A. O'Keefe and B. T. M. Willis