International Tables for Crystallography (2010). Vol. B, ch. 2.5, pp. 297-402   | 1 | 2 |
https://doi.org/10.1107/97809553602060000767

Chapter 2.5. Electron diffraction and electron microscopy in structure determination

Chapter index

Abbe theory 2.5.2.6
Aberrations 2.5.2.6
Absorption coefficient
phenomenological 2.5.2.5
Absorption in electron diffraction 2.5.5.3
Algebraic reconstruction technique (ART) 2.5.6.4
Alignment of electron-microscopy images 2.5.7.6
Annular dark-field detector 2.5.2.7
Approximations
Bethe, second 2.5.2.4
Born, first-order 2.5.2.2
forward-scattering 2.5.2.4
phase-object 2.5.2.4
projected charge-density 2.5.2.7
small-angle-scattering 2.5.2.2
two-beam 2.5.2.4
two-beam dynamical 2.5.8.8
weak-phase-object 2.5.2.7
ART (algebraic reconstruction technique) 2.5.6.4
Astigmatism 2.5.7.4
Asymmetric images 2.5.5.5
Autocorrelation function 2.5.8.1
Automated Patterson-map search 2.5.8.1
Backprojection 2.5.6.2
filtered 2.5.6.5
Bethe approximation
second 2.5.2.4
Bloch waves 2.5.2.2
Bootstrap technique 2.5.7.11
Born approximation
first-order 2.5.2.2
Born series 2.5.2.2
Borrmann effect 2.5.2.5
BP (bright-field pattern) 2.5.3.2.3
Bright-field image intensity 2.5.5.2
Bright-field pattern (BP) 2.5.3.2.3
Bulk plasmon excitation 2.5.2.2
CBED (convergent-beam electron diffraction) 2.5.2.10, 2.5.3
Central section theorem 2.5.6.1
Classification of electron-microscopy images 2.5.7.6
Clustering algorithms 2.5.7.6
Coherent convergent-beam electron diffraction 2.5.3.3.3, 2.5.3.11
Common line 2.5.7.8
Conformational variability 2.5.7.11
Contrast transfer function 2.5.6.4, 2.5.7.1
Convergent-beam electron diffraction (CBED) 2.5.2.10, 2.5.3
Convolution techniques 2.5.8.6
Cross correlation 2.5.7.11
Cross-correlation function 2.5.5.5
Cryo-electron microscopy (cryo-EM) 2.5.7.1
Cryo-EM (cryo-electron microscopy) 2.5.7.1
Crystal structure imaging 2.5.2.8
Dark-field pattern (DP) 2.5.3.2.2
Decagonal point groups 2.5.3.5.2, 2.5.3.15
Decagonal quasicrystals 2.5.3.5.2
Defects 2.5.2.1
Defocus 2.5.6.1
optimal 2.5.5.2
Scherzer 2.5.2.7
Scherzer, conditions 2.5.5.2
Density modification 2.5.8.5
Detectors
annular dark-field 2.5.2.7
Diffraction beams
intensities of 2.5.4.3
Diffraction
dynamical 2.5.8.8
Diffraction groups 2.5.3.2.1, 2.5.3.2.4, 2.5.3.2, 2.5.3.3, 2.5.3.4
Diffractometers, optical 2.5.5.5
Direct Fourier inversion 2.5.6.4
Direct phase determination
in electron crystallography 2.5.8
Discretization 2.5.6.3
Dispersion equations 2.5.2.2
Docking 2.5.7.11
DP (dark-field pattern) 2.5.3.2.2
Dynamical approximation, two-beam 2.5.8.8
Dynamical diffraction 2.5.8.8
theory 2.5.2.4
two-beam, formulae 2.5.2.5
Dynamical extinction 2.5.3.3.2, 2.5.3.3.4, 2.5.3.8, 2.5.3.9, 2.5.3.12
Dynamical scattering effects 2.5.8.1
Dynamical theory 2.5.2.4
EDSA (electron-diffraction structure analysis) 2.5.4
Electromagnetic electron lenses 2.5.2.1, 2.5.2.6
Electron crystallography 2.5.8.1
direct phase determination 2.5.8
of proteins 2.5.8.2
three-dimensional structure determination by 2.5.8.3
Electron diffraction
absorption in 2.5.5.3
sign conventions 2.5.2.3, 2.5.2.1
Electron-diffraction data
three-dimensional 2.5.8.4
Electron-diffraction patterns
geometric theory of 2.5.4.4
polycrystal 2.5.4.2
single-crystal 2.5.4.2
texture 2.5.4.2, 2.5.8.8
Electron-diffraction structure analysis (EDSA) 2.5.4
Electron lenses
electromagnetic 2.5.2.1, 2.5.2.6
Electron micrographs
Fourier transform of 2.5.8.7
phase information from 2.5.8.3
Electrons, interaction with matter 2.5.2.1
Electron tomography 2.5.7.3, 2.5.7.7
Envelope functions 2.5.2.7
Excitations
bulk plasmon 2.5.2.2
inner-shell 2.5.2.2
interband 2.5.2.2
intraband 2.5.2.2
Extinction
Field emission gun 2.5.2.10
Filtered backprojection 2.5.6.5
Filtered image 2.5.5.5
Filtering
rotational 2.5.5.5
First-order Born approximation 2.5.2.2
Forward-scattering approximation 2.5.2.4
Fourier analysis
and filtration in reciprocal space 2.5.5.5
Fourier images 2.5.2.8
Fourier inversion, direct 2.5.6.4
Fourier shell correlation (FSC) 2.5.7.9, 2.5.7.10
Fourier transforms
of electron micrographs 2.5.8.7
Friedel's law 2.5.2.1
FSC (Fourier shell correlation) 2.5.7.9, 2.5.7.10
Geometric theory of electron-diffraction patterns 2.5.4.4
Gridding method 2.5.6.6
Handedness 2.5.3.3.3
HDD (high-dispersion diffraction) 2.5.4.1
HEED (high-energy electron diffraction) 2.5.4.1
Helical symmetry 2.5.6.7
High-dispersion diffraction (HDD) 2.5.4.1
High-energy electron diffraction (HEED) 2.5.4.1
Higher-order Laue zone (HOLZ) reflections 2.5.3.1, 2.5.3.12
High-resolution electron diffraction (HRED) 2.5.4.1
High-resolution electron microscopy (HREM) 2.5.4.4
Hologram, in-line 2.5.2.10
HOLZ (higher-order Laue zone) reflections 2.5.3.1, 2.5.3.12
HRED (high-resolution electron diffraction) 2.5.4.1
HREM (high-resolution electron microscopy) 2.5.4.4
Icosahedral point groups 2.5.3.14
Icosahedral quasicrystals 2.5.3.5.1
Image averaging in real space 2.5.5.5
Image enhancement 2.5.5.1, 2.5.5.5
Image intensity, bright-field 2.5.5.2
Image processing in transmission electron microscopy 2.5.5.1
Image reconstruction 2.5.5
Image resolution 2.5.2.9
Image restoration 2.5.5.1, 2.5.5.2
Images
asymmetric 2.5.5.5
filtered 2.5.5.5
Fourier 2.5.2.8
with point symmetry 2.5.5.5
Incommensurately modulated structures 2.5.3.4.1
Inelastic scattering 2.5.2.2
In-line hologram 2.5.2.10
Inner-shell excitations 2.5.2.2
Instrumental resolution 2.5.2.9
Intensities of diffraction beams 2.5.4.3
Interaction of electrons with matter 2.5.2.1
Interband excitation 2.5.2.2
Interpolation 2.5.6.3
Intraband excitation 2.5.2.2
Kinematical approximation 2.5.2.2, 2.5.2.4, 2.5.4.3, 2.5.8.8
Kinematical diffraction
formulae 2.5.2.5
intensities 2.5.2.5
Kinematical scattering 2.5.2.2
Known structural fragment, use of 2.5.8.1
LACBED (large-angle convergent-beam electron diffraction) 2.5.3.4.1
Large-angle convergent-beam electron diffraction (LACBED) 2.5.3.4.1
Least resolvable distance 2.5.2.9
LEED (low-energy electron diffraction) 2.5.4.1
Low-energy electron diffraction (LEED) 2.5.4.1
Maximum entropy 2.5.8.7
Maximum likelihood 2.5.8.7
MBD (microbeam diffraction) 2.5.4.1
Microanalysis 2.5.1, 2.5.2.1
Microbeam diffraction (MBD) 2.5.4.1
Mosaicity 2.5.4.2
Multireference alignment 2.5.7.8
Multislice 2.5.2.8
Observation plane 2.5.5.1
Optical diffractometer 2.5.5.5
Optimal defocus 2.5.5.2
Patterson map, automated search 2.5.8.1
Pendellösung 2.5.2.5
Pentagonal point groups 2.5.3.5.2, 2.5.3.15
Periodic weak phase objects 2.5.5.5
Periodograms 2.5.7.4, 2.5.7.4
Phase determination
direct, in electron crystallography 2.5.8
Phase information
from electron micrographs 2.5.8.3
Phase invariant sums 2.5.8.3
Phase-object approximation 2.5.2.4
Phenomenological absorption coefficients 2.5.2.5
Plasmons
bulk, excitation of 2.5.2.2
surface 2.5.2.2
Point-group determination by convergent-beam electron diffraction 2.5.3
Point groups
decagonal 2.5.3.5.2, 2.5.3.15
icosahedral 2.5.3.14
pentagonal 2.5.3.5.2, 2.5.3.15
Point-spread function 2.5.6.1
Polycrystal electron-diffraction patterns 2.5.4.2
Power spectrum 2.5.7.1
Probability density of samples for images 2.5.5.5
Projected charge-density approximation 2.5.2.7
Projection(s)
tilt 2.5.8.2
use in three-dimensional reconstruction 2.5.6.1
Projection diffraction groups 2.5.3.2.6, 2.5.3.3
Projection matching, three-dimensional 2.5.7.9
Proteins
electron crystallography of 2.5.8.2
Quasicrystals
decagonal 2.5.3.5.2
icosahedral 2.5.3.5.1
symmetry determination of 2.5.3.5
Radiation damage 2.5.2.1
Radon transform 2.5.6.1
Random conical tilt 2.5.7.3, 2.5.7.7
Ray transform 2.5.6.1, 2.5.6.1
Reciprocity relationship 2.5.2.6
Reciprocity theorem of scattering theory 2.5.3.2, 2.5.3.2.2
Reconstruction
image 2.5.5
single-particle 2.5.6.1, 2.5.7
three-dimensional 2.5.6
Refinement
in single-particle reconstruction 2.5.7.9
Reflection high-energy electron diffraction (RHEED) 2.5.4.1
Refractive index 2.5.2.2
Relativistic effects 2.5.2.2
Resolution
image 2.5.2.9
instrumental 2.5.2.9
RHEED (reflection high-energy electron diffraction) 2.5.4.1
RMBD (rocking microbeam diffraction) 2.5.4.1
Rocking microbeam diffraction (RMBD) 2.5.4.1
Rotational filtering 2.5.5.5
SAED (selected-area electron diffraction) 2.5.2.10
Scanning microbeam diffraction (SMBD) 2.5.4.1
Scanning transmission electron microscope (STEM) 2.5.2.6
Scattering
inelastic 2.5.2.2
kinematical 2.5.2.2
thermal diffuse 2.5.2.2
Scattering matrix method 2.5.5.4
Scattering theory, reciprocity theorem of 2.5.3.2, 2.5.3.2.2
Scherzer defocus 2.5.2.7
conditions 2.5.5.2
Scherzer phase function 2.5.5.2
Schrödinger equation 2.5.2.2
Second Bethe approximation 2.5.2.4
Selected-area electron diffraction (SAED) 2.5.2.10
Shubnikov groups 2.5.3.2.1
Signal-to-noise ratio in electron microscopy 2.5.7.1, 2.5.7.10
Sign conventions for electron diffraction 2.5.2.3, 2.5.2.1
Simultaneous iterative reconstruction technique (SIRT) 2.5.6.4
Single-crystal electron-diffraction patterns 2.5.4.2
Single-particle reconstruction 2.5.6.1, 2.5.7
Singular value decomposition 2.5.6.4
SIRT (simultaneous iterative reconstruction technique) 2.5.6.4
Small-angle-scattering approximation 2.5.2.2
SMB (symmetrical many-beam) method 2.5.3.2.7
SMBD (scanning microbeam diffraction) 2.5.4.1
Space-group determination by convergent-beam electron diffraction 2.5.3
STEM (scanning transmission electron microscope) 2.5.2.6
Surface plasmons 2.5.2.2
Surface representation in cryo-EM 2.5.7.11
Symmetrical many-beam (SMB) method 2.5.3.2.7
Symmetry elements
three-dimensional 2.5.3.2.1, 2.5.3.2.2, 2.5.3.1
two-dimensional 2.5.3.2.1, 2.5.3.2.3, 2.5.3.1
Symmetry
helical 2.5.6.7
TDS (thermal diffuse scattering) 2.5.2.2
TEM (transmission electron microscope) 2.5.2.6
Texture electron-diffraction patterns 2.5.4.2, 2.5.8.8
THEED (transmission high-energy electron diffraction) 2.5.4.1
Thermal diffuse scattering (TDS) 2.5.2.2
Thick crystals 2.5.5.4
Thon rings 2.5.7.4
Three-dimensional electron-diffraction data 2.5.8.4
Three-dimensional projection matching 2.5.7.9
Three-dimensional reconstruction 2.5.6
Three-dimensional structure determination by electron crystallography 2.5.8.3
Three-dimensional symmetry elements 2.5.3.2.1, 2.5.3.2.2, 2.5.3.1
Through-focus series method 2.5.5.3
Tilt projections 2.5.8.2
Tomography, electron 2.5.7.3, 2.5.7.7
Transfer function
of lens 2.5.2.6
Transforms
Radon 2.5.6.1
Transmission electron microscope (TEM) 2.5.2.6
Transmission high-energy electron diffraction (THEED) 2.5.4.1
Two-beam approximation 2.5.2.4
Two-beam dynamical approximation 2.5.8.8
Two-beam dynamical diffraction formulae 2.5.2.5
Two-dimensional symmetry elements 2.5.3.2.1, 2.5.3.2.3, 2.5.3.1
Voronoi diagram 2.5.6.6
Wavelengths 2.5.2.1
Weak-phase-object approximation 2.5.2.7
Weak phase objects 2.5.5.2
periodic 2.5.5.5
Whole pattern (WP) 2.5.3.2.3
WP (whole pattern) 2.5.3.2.3
ZAP (zone-axis pattern) 2.5.3.2.3
Zeroth-order Laue zone (ZOLZ) reflections 2.5.3.1, 2.5.3.9
ZOLZ (zeroth-order Laue zone) reflections 2.5.3.1, 2.5.3.9
Zone-axis pattern (ZAP) 2.5.3.2.3