Tables for
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C, ch. 2.9, pp. 126-146
doi: 10.1107/97809553602060000584

Chapter 2.9. Neutron reflectometry

G. S. Smitha and C. F. Majkrzakb

aManuel Lujan Jr Neutron Scattering Center, Los Alamos National Laboratory, Los Alamos, NM 87545, USA, and bNIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA


Berk, N. F. & Majkrzak, C. F. (1995). Using parametric B-splines to fit specular reflectivities. Phys. Rev. B, 51, 11296–11309.
Boer, D. K. G. de (1994). Influence of the roughness profile on the specular reflectivity of X-rays and neutrons. Phys. Rev. B, 49, 5817–5820.
Buttiker, M. (1983). Larmor precession and the traversal time for tunneling. Phys. Rev. B,27, 6178–6188.
Felcher, G. P., Hilleke, R. O., Crawford, R. K., Haumann, J., Kleb, R. & Ostrowski, G. (1987). Polarized neutron reflectometer: a new instrument to measure magnetic depth profiles. Rev. Sci. Instrum. 58, 609–619.
Felcher, G. P. & Russell, T. P. (1991). Editors. Physica (Utrecht), B173, 1–210.
Hamilton, W. A., Hayter, J. B. & Smith, G. S. (1994). Neutron reflectometry as optical imaging. J. Neutron Res. 2, 1–19.
Holy, V., Kubena, J., Ohlidal, I., Lischka, K. & Plotz, W. (1993). X-ray reflection from rough layered systems. Phys. Rev. B, 47, 15896–15903.
Majkrzak, C. F. (1991). Polarized neutron reflectometry. Physica (Utrecht), B173, 75–88.
Majkrzak, C. F., Ankner, J. F., Berk, N. F. & Gibbs, D. (1994). Magnetic multilayers, edited by L. H. Bennett & R. E. Watson, pp. 299–354. Singapore: World Scientific.
Merzbacher, E. (1970). Quantum mechanics, 2nd ed. New York: John Wiley.
Nevot, L. & Croce, P. (1980). Caracterisation des surfaces par reflexion rasante de rayons X. Application a l'etude du polissage de quelques verres silicates. Rev. Phys. Appl. 15, 761–779.
Nuñez, V., Majkrzak, C. F. & Berk, N. F. (1993). Dynamical scattering of polarized neutrons by thin magnetic films. MRS Symp. Proc. 313, 431–436.
Pedersen, J. S. & Hamley, I. W. (1994). Analysis of neutron and X-ray reflectivity data by constrained least-squares methods. Physica (Utrecht), B198, 16–23.
Penfold, J. & Thomas, R. K. (1990). The application of specular reflection of neutrons to the study of surfaces and interfaces. J. Phys. Condens. Matter, 2, 1369–1412.
Pynn, R. (1992). Neutron scattering by rough surfaces at grazing incidence. Phys. Rev. B, 45, 602–612.
Russell, T. P. (1990). X-ray and neutron reflectivity for the investigation of polymers. Mater. Sci. Rep. 5, 171–271.
Schreyer, A., Zeidler, T., Morawe, C., Metoki, N., Zabel, H., Ankner, J. F. & Majkrzak, C. F. (1993). Spin polarized neutron reflectivity study of a Co/Cu superlattice. J. Appl. Phys. 73, 7616–7621.
Sears, V. F. (1989). Neutron optics. Oxford University Press.
Sears, V. F. (1993). Generalized distorted-wave Born approximation for neutron reflection. Phys. Rev. B, 48, 17477–17485.
Sinha, S. K., Sirota, E. B., Garroff, S. & Stanley, H. B. (1988). X-ray and neutron scattering from rough surfaces. Phys. Rev. B, 38, 2297–2311.
Smith, G. S., Hamilton, W., Fitzsimmons, M., Baker, S. M., Hubbard, K. M., Nastasi, M., Hirvonen, J.-P. & Zocco, T. G. (1992). Neutron reflectivity study of thermally-induced boron diffusion in amorphous elemental boron. SPIE Proc. Ser. 1738, 246–253.
Steinhauser, K. A., Steryl, A., Scheckenhofer, H. & Malik, S. S. (1980). Observation of quasibound states of the neutron in matter. Phys. Rev. Lett. 44, 1306–1309.
Wiesler, D. G., Feigin, L. A., Majkrzak, C. F., Ankner, J. F., Berzina, T. S. & Troitsky, V. I. (1995). Neutron and X-ray reflectivity study of Ba salts of alternating bilayers of deuterated and hydrogenated stearic acid. Thin Solid Films, 266, 69–77.
Yamada, S., Ebisawa, T., Achiwa, N., Akiyoshi, T. & Okamoto, S. (1978). Neutron-optical properties of a multilayer system. Annu. Rep. Res. React. Inst. Kyoto Univ. 11, 8–27.
Zhou, X.-L. & Chen, S.-H. (1993). Model-independent method for reconstruction of scattering-length-density profiles using neutron or X-ray reflectivity data. Phys. Rev. E, 47, 3174–3190.