International Tables for Crystallography (2006). Vol. C, ch. 3.5, pp. 171-176
https://doi.org/10.1107/97809553602060000589

Chapter 3.5. Preparation of specimens for electron diffraction and electron microscopy

Chapter index

Anode current/voltage relationship
electrochemical thinning 3.5.2.3, 3.5.3.1
Cast films 3.5.3.1
Ceramics
preparation of specimens 3.5.1
Chemical
etchants for thin section preparation 3.5.1.1
etching 3.5.1.4
polishing 3.5.2
thinning 3.5.2.3
Corundum
etching 3.5.1.4
Direct crystallization 3.5.3, 3.5.3.1
Disc specimens 3.5.1, 3.5.1, 3.5.1, 3.5.1.2, 3.5.1.2, 3.5.1.2
Disc thinning method 3.5.2.1, 3.5.2.2, 3.5.2.2, 3.5.2.2
Electrochemical thinning 3.5.2.3
Electron diffraction
preparation of specimens 3.5.1
Electron microscopy
preparation of specimens 3.5.1
Electron-transparent specimens 3.5.1
Electropolishing 3.5.2
Epitaxic formation 3.5.3.2, 3.5.3.3
Etching
chemical 3.5.1.1
corundum 3.5.1.4
ion sources 3.5.1.3
sputter 3.5.1.3
Evaporated thin films 3.5.1.5
Ion-beam thinning 3.5.1, 3.5.1.2, 3.5.1.3
Ion sources for etching 3.5.1.3
Metals
preparation of specimens 3.5.2
Microtome 3.5.1.1
Multilayer materials 3.5.1, 3.5.1, 3.5.1.1
Organic compounds
preparation of specimens for electron diffraction and electron microscopy 3.5.3
Oriented solidification 3.5.3.3
Petrographic sections 3.5.1.2, 3.5.1.2
Phosphoric acid as etchant 3.5.1.4
Polishing 3.5.2.2
Polymers
preparation of specimens for electron diffraction and electron microscopy 3.5.3
Preparation
of specimens for electron diffraction and electron microscopy 3.5.1
Rock minerals
preparation of specimens 3.5.1
Spark erosion 3.5.2.1
Specimen
preparation 3.5.1
Sputtered thin films 3.5.1.5
Sputter etching 3.5.1.3
Sublimed films 3.5.3.2
TEM (transmission electron microscopy) 3.5.1
Thin films and thinning 3.5.1.5
Thinning solution 3.5.2.3
Thin sections 3.5.1.2, 3.5.2.1
Transmission electron microscopy (TEM)
preparation of specimens 3.5.1
Ultramicrotomy 3.5.1.1
Window thinning method 3.5.2.1