Tables for
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C, ch. 4.1, pp. 186-190

Chapter 4.1. Radiations used in crystallography

V. Valvodaa

aDepartment of Physics of Semiconductors, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Praha 2, Czech Republic


Bonse, U. (1980). X-ray sources. Characterization of crystal growth defects by X-ray methods, edited by B. K. Tanner & D. K. Bowen, Chap. 11, pp. 298–319. New York: Plenum. [NATO Advanced Study Institute Series B63.]
Bordas, J. (1980). A synchrotron radiation camera and data acquisition system for time resolved X-ray scattering studies. J. Phys. E, 13, 938–944.
Cowley, J. M. (1975). Diffraction physics, Chap. 1. Amsterdam: North-Holland.
Ertl, G. & Küppers, J. (1974). Monographs in modern chemistry, Vol. 4. Energy electrons and surface chemistry, edited by H. F. Ebel, Chap. 9, pp. 129–192. Weinheim: Verlag Chemie.
Feldman, C., Mayer, J. W. & Picraux, S. T. (1982). Materials analysis by ion channeling. London: Academic Press.
Frankel, R. D. & Forsyth, J. M. (1979). Nanosecond X-ray diffraction from biological samples with a laser-produced plasma source. Science, 204, 622–624.
Grasselli, J. G., Snavely, M. K. & Bulkin, B. J. (1980). Applications of Raman spectroscopy. Physics reports 65, No. 4, pp. 231–344. Amsterdam: North-Holland.
Gyax, F. N., Kündig, W. & Meier, P. F. (1979). Editors. Muon spin rotation. Amsterdam: North-Holland.
Hansen, N. K. & Schneider, J. R. (1984). Charge-density distribution of Be metal studied by γ-ray diffractometry. Phys. Rev. B, 29, 917–926.
Kaufmann, E. N. & Shenoy, G. K. (1981). Editors. MRS symposia proceedings, Vol. 3. Nuclear and electron resonance spectroscopies applied to materials science. New York: North-Holland.
Kunz, C. (1979). Editor. Topics in current physics, Vol. 10. Synchrotron radiation, techniques and applications. Berlin: Springer Verlag.
Kuz'min, R. N., Kolpakov, A. V. & Zhdanov, G. S. (1966). Rassejanie messbauerovskovo izlutschenija kristallami. Kristallografiya, 11, 511–519. [English translation: Sov. Phys. Crystallogr. (1967), 11, 457–465.]
Lee, P. A., Citrin, P. H., Eisenberger, P. & Kincaid, B. M. (1981). Extended X-ray absorption fine structure – its strengths and limitations as a structural tool. Rev. Mod. Phys. 53, 769–806.
Marshall, W. & Lovesey, S. W. (1971). Theory of thermal neutron scattering. Oxford: Clarendon Press.
Parsons, D. F. (1980). Editor. Ultrasoft X-ray microscopy: its application to biological and physical sciences. New York: New York Academy of Sciences.
Plummer, E. W. & Eberhardt, W. (1982). Advances in chemical physics, Vol. XLIX. Angle-resolved photoemission as a tool for the study of surfaces, edited by I. Prigogine & S. I. Rice. New York: John Wiley.
Rosier, D. J. de & Klug, A. (1968). Reconstruction of three dimensional structures from electron micrographs. Nature (London), 217, 130–134.
Schneider, J. R. (1983). Characterization of crystals by γ-ray and neutron diffraction methods. J. Cryst. Growth, 65, 660–671.
Siegel, R. W. (1980). Positron annihilation spectroscopy. Annu. Rev. Mater. Sci. 10, 393–425.
Tanner, B. K. & Bowen, D. K. (1980). Editors. Characterization of crystal growth defects by X-ray methods. NATO Advanced Study Institute Series B63. New York: Plenum.
Windsor, C. G. (1981). Pulsed neutron scattering. London: Taylor and Francis.