International Tables for Crystallography (2006). Vol. C, ch. 4.2, pp. 191-258
https://doi.org/10.1107/97809553602060000592

Chapter 4.2. X-rays

Chapter index

Absorption
edges, wavelengths of 4.2.2.4, 4.2.2.12, 4.2.2.12, 4.2.2.2, 4.2.2.5
of generated X-rays in target 4.2.1.1.1
Anomalous dispersion (scattering) 4.2.6
not anomalous 4.2.6
Atomic form factor 4.2.6.1.3
Atomic scattering factors 4.2.6.1.3
Balanced filters 4.2.5.3
Bandwidth 4.2.1.5, 4.2.1.6
Bending magnets 4.2.1.5, 4.2.1.7, 4.2.1.5, 4.2.1.5, 4.2.1.5
Bijvoet-pair intensity ratios 4.2.6.3.2
Bijvoet-pair techniques 4.2.6.3.2.2
Black-body radiation in X-ray region 4.2.1.6
Bremsstrahlung 4.2.1
Brilliance, synchrotron radiation 4.2.1.5, 4.2.1.5
Causality, principle of 4.2.6.2.3.2
Characteristic line spectrum 4.2.1.1
Characteristic radiation, efficiency of production 4.2.1.1.1
Compton scattering 4.2.6.1.1
Continuous spectrum 4.2.1.1.1, 4.2.1.2
Critical wavelength 4.2.1.5, 4.2.1.5, 4.2.1.9
DAS (differential anomalous X-ray scattering) technique 4.2.3.4.1.3, 4.2.3.4.1.3
Delbrück scattering 4.2.6.1.1
Diagram levels 4.2.1.1, 4.2.1.1, 4.2.1.1, 4.2.1.2
Differential anomalous X-ray scattering (DAS) technique 4.2.3.4.1.3, 4.2.3.4.1.3
Diffraction absorption fine structure (DAFS) 4.2.6.3.3.4
Dirac–Fock 4.2.2.8, 4.2.2.9, 4.2.2.10
Dispersion corrections 4.2.6, 4.2.6.1.3, 4.2.6.2.3.1, 4.2.6.3.2
tables of 4.2.6.8
theory of 4.2.6.2
Duane–Hunt limit 4.2.1.2, 4.2.1.2
EELS (electron energy-loss spectroscopy) 4.2.3.4.1.3
Efficiency of the production of characteristic radiation 4.2.1.1.1
Electron binding energies 4.2.2.7, 4.2.2.7, 4.2.2.7, 4.2.2.7
Electron energy-loss spectroscopy (EELS) 4.2.3.4.1.3
EXAFS (extended X-ray absorption fine structure) 4.2.3.1.3, 4.2.3.3, 4.2.3.4.1, 4.2.3.5, 4.2.6.3.3.4
Extended X-ray absorption fine structure [(E)XAFS] 4.2.3.1.3, 4.2.3.3, 4.2.3.4.1, 4.2.3.5, 4.2.3.1, 4.2.6.3.3.4
facilities for 4.2.3.1
Filters
balanced 4.2.5.3, 4.2.5.4.1
for X-rays 4.2.5
optimum-thickness 4.2.5.3
wavelength change by 4.2.5.3
Fluorescence techniques 4.2.3.4.1.3, 4.2.3.4.1.3
Friedel-pair intensity ratios 4.2.6.3.2
Friedel-pair techniques 4.2.6.3.2.2
Generation of X-rays 4.2.1
Hartree–Fock
model 4.2.6.1.3
Insertion devices 4.2.1.5, 4.2.5.5, 4.2.5.4.1, 4.2.5.4.3
Intensity
of characteristic lines 4.2.1.1.1
IUPAC notation
X-ray diagram levels 4.2.1.1
Kramer's constant 4.2.1.2
Kramers–Kronig transform 4.2.6.2.2
Lattice-parameter measurements
possible effect of filter 4.2.5.3
Linear attenuation coefficient 4.2.3.1.1, 4.2.3.1.1, 4.2.3.2.1
Line focus 4.2.1.3, 4.2.1.3
Magnets, bending 4.2.1.5
Mass absorption coefficients 4.2.3.1.1, 4.2.3.1.1
Mass attenuation coefficients 4.2.3.1.1, 4.2.3.1.3
tables of 4.2.4.3
Monochromators
double-reflection 4.2.5.4.3
for X-rays 4.2.5
graphite 4.2.5.4.2
multi-reflection 4.2.5.4.1, 4.2.5.4.3
single-reflection 4.2.5.4.2
Normal attenuation 4.2.3.1.3, 4.2.3.3, 4.2.3.3
Nuclear Thomson scattering 4.2.6.1.1
Pair-production cross sections 4.2.3.1
Pendellösung 4.2.6.3
Photo-effect data
theoretical 4.2.4.2.1
Photon interaction cross sections
tables of 4.2.4.2
Photon scattering cross section 4.2.3.1.1, 4.2.3.1.1, 4.2.3.2.2
Plasmas 4.2.1
Polarization 4.2.1.2, 4.2.1.5
Principle of causality 4.2.6.2.3.2
QED corrections 4.2.2.8, 4.2.2.11
Radionuclides 4.2.1.4, 4.2.1.5
Rayleigh scattering 4.2.6.1.1
Rayleigh scattering data
theoretical 4.2.4.2.2
Rotating-anode tubes 4.2.1.3, 4.2.1.3, 4.2.1.3
Scattering
Compton 4.2.6.1.1
Delbrück 4.2.6.1.1
Rayleigh 4.2.6.1.1
Scattering cross sections
elastic 4.2.3.1
inelastic 4.2.3.1
pair-production 4.2.3.1
total 4.2.3.1
total (tables) 4.2.4.2
Self-consistent field (Hartree–Fock) method 4.2.6.1.3
Siegbahn notation 4.2.1.1, 4.2.1.1, 4.2.1.2
Spectral brightness 4.2.1.5
synchrotron-radiation sources 4.2.1.5, 4.2.1.7, 4.2.1.7, 4.2.1.6, 4.2.1.11
Synchrotron radiation 4.2.1, 4.2.1
facilities (for EXAFS) 4.2.3.1
sources 4.2.1.5, 4.2.1.5
spectrum 4.2.1.6, 4.2.1.5
Theoretical photo-effect data 4.2.4.2.1
Theoretical Rayleigh scattering data 4.2.4.2.2
Thomas–Fermi model 4.2.6.1.3
Thomson scattering
by a free electron 4.2.6.1.1
Wavelength shifts 4.2.1.5
XAFS (extended X-ray absorption fine structure) 4.2.1.7, 4.2.3.1.3, 4.2.3.3, 4.2.3.4.1, 4.2.3.5, 4.2.3.1, 4.2.6.3.3.4
as a short-range-order phenomenon 4.2.3.4.1.3
data analysis 4.2.3.4.1
XANES (X-ray absorption near-edge structure) 4.2.3.1.3, 4.2.3.4.2, 4.2.4.1, 4.2.4.4, 4.2.6.5
X-ray absorption coefficients 4.2.4
absolute measurement of 4.2.3.2.3
data analysis of EXAFS 4.2.3.4.1
experimental techniques 4.2.3.2.3
X-ray absorption near-edge structure (XANES) 4.2.3.5, 4.2.4.1, 4.2.4.4, 4.2.6.5
X-ray absorption spectra 4.2.3, 4.2.4, 4.2.5
X-ray attenuation coefficients 4.2.4
X-ray dispersion corrections 4.2.6
X-ray interferometry 4.2.2.3
X-ray levels 4.2.1.1, 4.2.1.1
X-ray source(s) 4.2.1
radioactive 4.2.1, 4.2.1.4, 4.2.1.4
synchrotron 4.2.1, 4.2.1, 4.2.1.5
X-ray tube 4.2.1, 4.2.1.3
X-ray spectra
Bremsstrahlung 4.2.1
X-ray tubes 4.2.1.3
power dissipation in 4.2.1.3.1, 4.2.1.3.1