International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C, ch. 5.1, p. 490
https://doi.org/10.1107/97809553602060000595

Chapter 5.1. Introduction

A. J. C. Wilsona

aSt John's College, Cambridge, CB2 1TP, England

References

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Hubbard, C. R. (1983). New standard reference materials for X-ray powder diffraction. Adv. X-ray Anal. 26, 45–51.
Klug, H. P. & Alexander, L. E. (1974). X-ray diffraction procedures for polycrystalline and amorphous materials, 2nd ed. New York: John Wiley.
Okada, Y. & Tokumaru, Y. (1984). Precise determination of lattice parameter and thermal expansion coefficient of silicon between 300 and 1500 K. J. Appl. Phys. 56, 314–320.
Peiser, H. S., Rooksby, H. P. & Wilson, A. J. C. (1960). Editors. X-ray diffraction by polycrystalline materials, 2nd ed. London: Chapman & Hall.
Prince, E. & Stalick, J. K. (1992). Editors. Accuracy in powder diffraction. II. NIST Spec. Publ. No. 846.
Wilson, A. J. C. (1980). Accuracy in methods of lattice-parameter measurement. Accuracy in powder diffraction. Natl Bur. Stand. US Spec. Publ. No. 567.