International Tables for Crystallography (2006). Vol. C, ch. 5.2, pp. 491-504
https://doi.org/10.1107/97809553602060000596

Chapter 5.2. X-ray diffraction methods: polycrystalline

Chapter index

Aberrations
centroid displacements 5.2.4.1, 5.2.4
geometrical 5.2.3
of an energy-dispersive diffractometer 5.2.7.1
physical 5.2.3, 5.2.4.1
refraction 5.2.2.2
Accuracy 5.2.2.1, 5.2.2.1
factors determining 5.2.13
Analytical extrapolation of lattice
parameters 5.2.3.1, 5.2.3.2
Angle-dispersive diffractometry 5.2.1.1, 5.2.1.1, 5.2.1.1, 5.2.4, 5.2.5
Axial divergence 5.2.4.1, 5.2.7.1
Axial-divergence error 5.2.4.1
Backlash in diffractometer drives 5.2.13
Beam divergence 5.2.8.1
Best overall fit 5.2.3.1
Bond method 5.2.9
Bragg angle
errors 5.2.1.3
operational definitions 5.2.1.4
Bragg–Brentano (Parrish) angle-dispersive diffractometers 5.2.4
Camera methods for lattice-parameter determination 5.2.1.1, 5.2.1.1, 5.2.8
Centroid of a reflection 5.2.1.4
Centroid of wavelength distribution 5.2.2.1, 5.2.3.1, 5.2.3.1
Cerium oxide (intensity standard) 5.2.11, 5.2.11.1
Chromium oxide (intensity standard) 5.2.11, 5.2.11.1
Corundum
intensity standard 5.2.11, 5.2.11.1
Debye–Scherrer camera
aberrations in 5.2.8.1
Detection
of systematic error 5.2.9, 5.2.10
Diffractometers
Bragg–Brentano 5.2.1.4, 5.2.4
gears 5.2.13
Seemann–Bohlin 5.2.1.4, 5.2.4
Diffractometry
angle-dispersive 5.2.1.1, 5.2.1.1, 5.2.1.1, 5.2.4, 5.2.5
energy-dispersive 5.2.1.1
Energy-dispersive
diffractometer, aberrations of 5.2.7.1
methods, in lattice-spacing determination 5.2.7
techniques 5.2.7
Equatorial divergence 5.2.7.1
Errors
and uncertainties in wavelength 5.2.2.1
of the Bragg angle 5.2.1.3
External standard 5.2.10
Extrapolation in lattice-parameter determination
analytical 5.2.3.1, 5.2.3.2, 5.2.3.2
graphical 5.2.3.2
Factors determining accuracy 5.2.13
Film shrinkage 5.2.8.1
Fluctuations
in particle orientation 5.2.2.3
in recording counts 5.2.2.3
Fluorophlogopite reflection angles 5.2.10.6
Geometrical aberrations 5.2.3
Graphical extrapolation of lattice parameters 5.2.3.2
Inclination of plane of specimen 5.2.4.1
Intensity
standards 5.2.11
Internal
standard 5.2.10
Knife-edge calibration 5.2.8.1
Lanthanum hexaboride
instrumental sample 5.2.12
Lattice-parameter determination 5.2.1.1
aberrations in 5.2.3.1
least-squares methods 5.2.9, 5.2.9
powder diffraction 5.2.1.1
standards 5.2.10
systematic errors in 5.2.3.1, 5.2.9
wavelength problems 5.2.2
Lattice-parameter determination methods
camera 5.2.8
diffractometer 5.2.4, 5.2.5
energy-dispersive 5.2.7
polycrystalline X-ray 5.2.1.1
synchrotron 5.2.5
whole-pattern 5.2.6
Lattice parameters
of silicon 5.2.10
of silver 5.2.10
of tungsten 5.2.10
Least-squares refinement 5.2.13
Lorentz factor 5.2.7.1
Mean-square broadening 5.2.3.1
Measured profile
as a convolution 5.2.13
Microdiffractometers 5.2.1.1
Multichannel pulse-height analyser 5.2.7, 5.2.7, 5.2.7
NIST (National Institute of Standards and Technology)
silicon standard 5.2.5
Particle orientation, fluctuations 5.2.2.3
Peak
of a reflection 5.2.1.4
Photographic film
shrinkage 5.2.8.1
Physical aberrations 5.2.3
Powder diffraction
standards 5.2.10
Precision 5.2.2.3, 5.2.13
Profile fitting 5.2.1.4
computer procedures 5.2.1.4
Recording counts
fluctuations 5.2.2.3
Refinement
least-squares 5.2.13
Reflection
Refraction
correction for 5.2.2.2
Remanent systematic error
testing for 5.2.9
Rietveld method 5.2.3.1, 5.2.6
Rutile
intensity standard 5.2.11.1
Seemann–Bohlin diffractometers 5.2.4
Silicon
lattice parameter of 5.2.5, 5.2.10
Silver behenate reflection angles 5.2.10.7
Silver
lattice parameter of 5.2.10
Soller slits 5.2.4.1, 5.2.4.1, 5.2.4.1
Specimen
absorption 5.2.7.1, 5.2.8.1
displacement 5.2.4.1, 5.2.8.1
preparation 5.2.13
surface displacement 5.2.10, 5.2.13
transparency 5.2.4.1, 5.2.7.1, 5.2.10, 5.2.10
Standard reference materials 5.2.10
Standards
intensity 5.2.10
powder-diffraction 5.2.10
Standard specimens 5.2.12
Statistical fluctuations 5.2.2.3
Synchrotron radiation
determination of wavelength 5.2.5, 5.2.5
sources 5.2.5
Systematic errors 5.2.2.1, 5.2.13
detection and treatment 5.2.9, 5.2.10
testing for 5.2.9
Time-constant errors 5.2.1.4
Tungsten
lattice parameter of 5.2.10
reflection angles 5.2.10, 5.2.10.5
Wavelength problems 5.2.2
Wavelengths
errors 5.2.2.1
X-ray powder techniques 5.2.1.1
Zero-angle calibration 5.2.4.1
Zinc oxide (intensity standard) 5.2.11.1