International Tables for Crystallography (2006). Vol. C, ch. 5.3, pp. 505-536
https://doi.org/10.1107/97809553602060000597

Chapter 5.3. X-ray diffraction methods: single crystal

Chapter index

Absolute measurements 5.3.1.1
of lattice spacings 5.3.1.1
Accuracy of lattice-parameter (lattice-spacing) determination 5.3.1.1, 5.3.1.1, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2
relative 5.3.1.1
Arrangements giving partial reduction of systematic errors 5.3.4
Asymmetric (Straumanis) film mounting 5.3.2.3.4, 5.3.2.3.4
Back reflection 5.3.2.4.1, 5.3.2.4.1, 5.3.2.4.2
Bond method 5.3.1.2
Bragg angle
accuracy of 5.3.1.1, 5.3.1.2
determination 5.3.1.2
measurement of 5.3.1.1
Camera radius
extremely large 5.3.2.3.5
uncertainty, elimination 5.3.2.3.4, 5.3.2.3.4
Cameras
for recording lattice-parameter changes 5.3.2.3.5
Kossel 5.3.2.4.1
Characteristic X-rays
excitation 5.3.2.4.1
Comparison measurements of lattice parameters 5.3.1.2
Conical surface of an hkl reflection 5.3.2.4.1
Conic section 5.3.2.4.2, 5.3.2.4.3
Convolution 5.3.1.1, 5.3.1.1
Crystal profile 5.3.1.1
Crystal thickness
in transmission geometry 5.3.2.4.1
Data-processing
single-crystal methods 5.3.1.1
Defects
study of 5.3.1.1
Direct-lattice parameters 5.3.1.1, 5.3.1.1
Divergent-beam techniques 5.3.2.4
classification 5.3.2.4.2
Double-crystal spectrometers
with photographic recording 5.3.2.3.5
Effect on lattice parameters (examination)
of pressure 5.3.1.2
Effect on lattice parameters
of electric field 5.3.1.2
of temperature 5.3.1.2, 5.3.2.3.4, 5.3.2.3.5
Eigenvalue filtering 5.3.2.3.4
Energy-dispersive
methods, in lattice-spacing determination 5.3.1.2
Epitaxic layers, study of 5.3.2.4.4
Excitation of characteristic X-rays 5.3.2.4.1
Extrapolation in lattice-parameter determination 5.3.1.1, 5.3.2.3.4
Film shrinkage
error, elimination of 5.3.2.3.4, 5.3.2.3.4
Half-width 5.3.1.1
minimum 5.3.1.1
of wavelength distribution 5.3.1.1
High-angle Bragg reflections
in lattice-parameter determination 5.3.2.3.4
Identity period determination 5.3.2.3.1
accuracy of 5.3.2.3.4
Interplanar spacing determination
accuracy of 5.3.1.1, 5.3.1.1
precision of 5.3.1.1, 5.3.1.1
Kossel
camera 5.3.2.4.1
lines, intersections of 5.3.2.4.1, 5.3.2.4.2
method 5.3.2.4
plane 5.3.2.4.2
Kβ line in lattice-spacing determination 5.3.1.2
Lattice-parameter changes
study of 5.3.1.2, 5.3.2.3.5
Lattice-parameter determination 5.3.1.1
absolute 5.3.1.1
from one crystal mounting 5.3.2.3.3
from separate photographs 5.3.2.3.1
of deformed lattice 5.3.2.4.2, 5.3.2.4.2
of large flat slab 5.3.1.2
of polycrystals (Kossel method) 5.3.2.4.4
of single crystals 5.3.1.1
of small spherical crystals 5.3.1.2
of standard crystal 5.3.1.2
powder diffraction 5.3.1.1, 5.3.1.1, 5.3.1.1, 5.3.2.3.4, 5.3.2.3.4
preliminary 5.3.1.2
relative 5.3.1.1
sensitivity of 5.3.1.1, 5.3.1.2
Lattice-parameter determination methods
non-dispersive 5.3.1.2, 5.3.1.2
pseudo-non-dispersive 5.3.1.2
single-crystal X-ray 5.3.1.1
Lattice-parameter differences
determination of 5.3.1.2
Laue photography
combined with powder diffraction 5.3.1.1
Least-squares refinement 5.3.1.1, 5.3.2.3.4
Lens configuration 5.3.2.4.2
Lens-shaped figures 5.3.2.4.1, 5.3.2.4, 5.3.2.4.3
Measured profile 5.3.1.1
Measurements of lattice parameters
absolute 5.3.1.1
relative 5.3.1.1
Misalignment 5.3.1.2
Multiple diffraction 5.3.2.4.2
Multiple-diffraction methods
with photographic recording 5.3.2.4.2
Multiple-exposure techniques 5.3.2.4.2, 5.3.2.5
Non-dispersive methods (techniques) 5.3.1.2, 5.3.1.2
Original profile 5.3.1.1
Oscillation photographs processing 5.3.2.3.4, 5.3.2.3.4
Perfect single crystals 5.3.2.3.5
Phase diagrams, determination of 5.3.2.3.5
Phase transitions, study of 5.3.2.3.5
Photographic methods
single-crystal 5.3.2
single-crystal, classification of 5.3.1.2
Powder diffraction
combined with Laue photography 5.3.1.1
Powder methods
compared with single-crystal methods 5.3.1.1, 5.3.1.1
Precision of lattice-spacing determination 5.3.1.1
relative 5.3.1.1
Pressure, effect on lattice parameters
study of 5.3.1.2
Profile fitting
in oscillation photographs 5.3.2.3.4
Pseudo-non-dispersive methods 5.3.1.2
radiation
elimination 5.3.2.3.5
Ratio method
for powder samples 5.3.2.3.4
for single crystals 5.3.2.3.4
Reciprocal cell
picture of, three-dimensional 5.3.2.3.3
picture of, two-dimensional 5.3.2.3.2
picture of, undeformed 5.3.2.3.2
Reciprocal lattice
geometry 5.3.2.4.2
Refinement
least-squares 5.3.1.1, 5.3.2.3.4
Refraction
correction for 5.3.1.1
Relative measurements of lattice spacing 5.3.1.1
Single-crystal methods
compared with powder methods 5.3.1.1, 5.3.1.1
photographic 5.3.2
Single-crystal X-ray techniques 5.3.1.1
Small spherical crystals
lattice-parameter determination of 5.3.1.2
Sources of X-radiation 5.3.1.2
Spectrometers
double-crystal 5.3.2.3.5
Standard crystal 5.3.1.2
lattice-parameter determination of 5.3.1.2
Statistical errors
of lattice-parameter determination 5.3.1.1
Stereographic projection of Kossel pattern 5.3.2.3
Strain, measurement of 5.3.2.3.5
Strainmeter 5.3.2.3.5
Straumanis film mounting 5.3.2.3.4
Stress
study of 5.3.2.3.5
Symmetric arrangement in single-crystal methods 5.3.2.3.4
Systematic errors
in divergent-beam methods 5.3.2.4.3
in photographic methods 5.3.2.4.3
reduced by detailed analysis of Kossel patterns 5.3.2.4.2
reduced experimentally 5.3.2.4.2, 5.3.3.4.2, 5.3.3.4.3.2
reduced owing to extrapolation 5.3.1.1, 5.3.2.3.4, 5.3.2.3.4
Temperature dependence of lattice parameters
examination 5.3.1.2
Thermal effects, error connected with 5.3.2.4.3
Thermal expansion
Thickness
of crystal (sample) 5.3.2.4.1, 5.3.2.4.1
Topography 5.3.3.5, 5.3.3.7.4
Transmission geometry 5.3.2.4.1, 5.3.2.4.1
crystal thickness for 5.3.2.4.1, 5.3.2.4.2
Umweganregung 5.3.3.6
Wavelength determination 5.3.1.1, 5.3.1.2
errors in 5.3.4
Wavelengths
distribution 5.3.1.1, 5.3.1.2
White radiation
in lattice-parameter determination 5.3.1.2, 5.3.2.1
X-ray beam
highly divergent 5.3.1.2, 5.3.2.1, 5.3.2.4, 5.3.2.4.1
in single-crystal techniques 5.3.1.2
well collimated 5.3.1.2, 5.3.1.2, 5.3.2.1, 5.3.2.1
X-ray source(s)
in the sample 5.3.2.4.1
on the sample 5.3.2.4.1
outside the sample 5.3.2.4.1
X-ray spectrometers
Bragg 5.3.2.3.4
symmetric 5.3.2.3.4
X-ray wavelengths
in single-crystal methods 5.3.1.2, 5.3.1.2