International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C, ch. 5.4, pp. 537-540
https://doi.org/10.1107/97809553602060000598

Chapter 5.4. Electron-diffraction methods

A. W. S. Johnsona and A. Olsenb

aCentre for Microscopy and Microanalysis, University of Western Australia, Nedlands, WA 6009, Australia, and bDepartment of Physics, University of Oslo, PO Box 1048, N-0316 Blindern, Norway

References

Edington, J. W. (1975). Electron diffraction in the electron microscope. Monographs in practical electron microscopy in materials science, No. 2. Eindhoven: N. V. Philips Gloeilampenfabrieken.
FitzGerald, J. D. & Johnson, A. W. S. (1984). A simplified method of electron microscope voltage measurement. Ultramicroscopy, 12, 231–236.
Gard, J. A. (1976). Electron microscopy in mineralogy, p. 52. Berlin: Springer.
Gjønnes, J. & Olsen, A. (1984). Analytical electron microscopy. JEOL News, 22E, 13–18.
Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W. & Whelan, M. J. (1965). Electron microscopy of thin crystals. London: Butterworth.
Høier, R. (1969). A method to determine the ratio between lattice parameter and electron wavelength from Kikuchi line intersections. Acta Cryst. A25, 516–518.
International Tables for Crystallography (2005). Vol. A. Heidelberg: Springer.
Jones, P. M., Rackham, G. M. & Steeds, J. W. (1977). Higher order Laue zone effects in electron diffraction and their use in lattice parameter determination. Proc. R. Soc. London Ser. A, 354, 197–222.
LePage, Y. (1992). Ab initio primitive cell parameters from single convergent beam patterns: a converse route to the identification of microcrystals with electrons. Microsc. Res. Tech. 21, 158–165.
Olsen, A. (1976a). Lattice parameter determination using Kikuchi-line intersections: application to olivine and feldspar. J. Appl. Cryst. 9, 9–13.
Olsen, A. (1976b). Determination of lattice constants using Kikuchi line intersections. Solid State Group Report Series. Institute of Physics, University of Oslo, Norway.
Rackham, G. M., Jones, P. M. & Steeds, J. W. (1974). Upper layer diffraction effects in zone axis patterns. Proceedings of the Eighth International Congress on Electron Microscopy, Canberra, Australia, pp. 336–337.
Steeds, J. W. (1979). Convergent beam electron diffraction. Introduction to analytical electron microscopy, edited by J. J. Hren, J. I. Goldstein & D. C. Joy, pp. 387–422. New York: Plenum.
Thomas, G. (1970). Kikuchi electron diffraction and applications. Modern diffraction and imaging techniques in material science, edited by S. Amelinckx, S. Gevers, G. Remaut & J. Van Landuyt, pp. 131–185. Amsterdam: North-Holland.
Uyeda, R., Nonoyama, M. & Kogiso, M. (1965). Determination of the wavelength of electrons from a Kikuchi pattern. J. Electron Microsc. 14, 296–300.
Walker, A. R. & Booker, G. R. (1982). A selected-area channelling pattern (SACP) method for measuring small local changes in lattice parameter with bulk specimens. Electron microscopy 1982, Vol. 1, pp. 651–652. Hamburg: Elsevier.
Zuo, J. M. (1993). New method of Bravais lattice determination. Ultramicroscopy, 52, 459–464.