International Tables for Crystallography (2006). Vol. C, ch. 5.4, pp. 537-540
https://doi.org/10.1107/97809553602060000598

Chapter 5.4. Electron-diffraction methods

Chapter index

Accelerating voltage
of a transmission electron microscope, determination 5.4.2
CBED (convergent-beam electron diffraction) 5.4.2
Convergent-beam electron diffraction (CBED) 5.4.2
Electron diffraction
lattice-parameter determination 5.4.1.1
pattern analysis 5.4.1.1
pattern indexing 5.4.1.1
selected-area 5.4.2
Electron wavelength of a transmission electron microscope, determination 5.4.2
High-order Laue zone (HOLZ) 5.4.2
HOLZ (high-order Laue zone) 5.4.2
Kikuchi techniques 5.4.2
Lattice-parameter determination 5.4.2, 5.4.2
HOLZ techniques 5.4.2
Kikuchi techniques 5.4.2
Lattice-parameter determination methods
electron diffraction 5.4.2
Orientation matrix 5.4.1.1
Scanning electron microscopy (SEM) 5.4.2
Selected-area channelling patterns 5.4.2, 5.4.2.3
Selected-area electron diffraction 5.4.2
SEM (scanning electron microscopy) 5.4.2
TEM (transmission electron microscopy) 5.4.2
Transmission electron microscopy (TEM) 5.4.2