International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C, ch. 7.4, p. 664

Figure 7.4.4.7 

P. Suorttic
[Figure 7.4.4.7]
Figure 7.4.4.7

Three measurements of the 220 reflection of Ni at λ = 1.541 Å scaled to the same peak value; (a) in linear scale, (b) in logarithmic scale. Dotted curve: graphite (00.2) Johann monochromator, conventional 0.1 mm wide X-ray source (Suortti & Jennings, 1977[link]); solid curve: quartz (10.1) Johansson monochromator, conventional 0.05 mm wide X-ray source; broken curve: synchrotron radiation monochromatized by a (+, −) pair of Si (111) crystals, where the second crystal is sagittally bent for horizontal focusing (Suortti, Hastings & Cox, 1985[link]). The horizontal line indicates the half-maximum value. In all cases, the effective slit width is much less than the FWHM of the reflection.