International Tables for Crystallography (2006). Vol. C, ch. 7.5, pp. 666-676
https://doi.org/10.1107/97809553602060000608

Chapter 7.5. Statistical fluctuations

Chapter index

Background counting rates 7.5.2, 7.5.4
Backlash in diffractometer drives 7.5.5.2
Bessel function 7.5.3, 7.5.3
Counting modes 7.5.2
background 7.5.4
erratic fluctuations 7.5.5.2
reflection only 7.5.2
total 7.5.2
Counting statistics 7.5.1, 7.5.2, 7.5.3, 7.5.3, 7.5.3, 7.5.4, 7.5.4, 7.5.5.1, 7.5.5.2, 7.5.7, 7.5.7
Dead-time 7.5.3, 7.5.5.1
Erratic fluctuations in counting rates 7.5.5.2
Fixed-count timing 7.5.4
Fixed-time counting 7.5.3
Fluctuations
in recording counts 7.5.3
Generalized Bessel function 7.5.3
High-tension supplies, unsmoothed 7.5.3
Hyperbolic Bessel function 7.5.3
Integrated intensity
of a reflection 7.5.2
Mains-voltage fluctuations 7.5.5.2
Measured-as-negative intensities 7.5.6
Optimization (of measurement) 7.5.7
Poisson distribution 7.5.3
difference of two 7.5.3
sum of two 7.5.3
Reflection-only counting rates 7.5.2
Statistical fluctuations 7.5.1
Total counting rates 7.5.2
Unsmoothed high-tension supplies 7.5.3