International Tables for Crystallography (2006). Vol. C, ch. 8.8, pp. 735-743
https://doi.org/10.1107/97809553602060000616

Chapter 8.8. Accurate structure-factor determination with electron diffraction

Chapter index

Absorption
coefficients for Bloch waves 8.8
Bethe approximation 8.8
Bloch-wave method 8.8
CBED (convergent-beam electron diffraction) 8.8
Convergent-beam electron diffraction (CBED) 8.8
Critical-voltage effect 8.8, 8.8
Debye–Waller factor 8.8, 8.8
Dispersion surfaces 8.8, 8.8
Electron diffraction
convergent-beam 8.8
Extinction
distance 8.8
Fourier potential 8.8
Intersecting-Kikuchi-line method 8.8
Kikuchi patterns 8.8
Kossel
pattern 8.8
Schrödinger wave equation 8.8
Structure factor(s)
determination 8.8
X-ray 8.8
Thickness
fringes 8.8