International
Tables for
Crystallography
Volume G
Definition and exchange of crystallographic data
Edited by S. R. Hall and B. McMahon

International Tables for Crystallography (2006). Vol. G, ch. 3.3, p. 128

Section 3.3.8.9. Use of an incident-intensity monitor

B. H. Tobya*

aNIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8562, USA
Correspondence e-mail: brian.toby@nist.gov

3.3.8.9. Use of an incident-intensity monitor

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For radiation sources for which the intensity may vary, such as synchrotron-radiation sources, the intensity of the incident radiation is measured using an incident-intensity monitor. This value may be specified for every data point using _pd_meas_counts_monitor (or _pd_meas_intensity_monitor) by including this data item in the loop with the diffraction intensities. For some instruments, counting times are set so that the same number of monitor counts are measured for each data point. If this is the case, _pd_meas_counts_monitor will be the same for every data point and need not be included in the loop.








































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