International
Tables for
Crystallography
Volume H
Powder diffraction
Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk

International Tables for Crystallography (2018). Vol. H, ch. 1.1, p. 13

Figure 1.1.19 

R. E. Dinnebiera* and S. J. L. Billingeb,c

aMax-Planck-Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany,bDepartment of Applied Physics and Applied Mathematics, Columbia University, 500 West 120th Street, Room 200 Mudd, MC 4701, New York, NY 10027, USA, and cCondensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, PO Box 5000, Upton, NY 11973–5000, USA
Correspondence e-mail:  r.dinnebier@fkf.mpg.de

[Figure 1.1.19]
Figure 1.1.19

Peak fits of three selected reflections for an LaB6 standard measured with Mo Kα1 radiation (λ = 0.7093 Å) from a Ge(220) monochromator in Debye–Scherrer geometry using the fundamental-parameter approach. (a) A pure Lorentzian emission profile with a half width of 0.2695 mÅ is applied, refining the peak position and intensity only; (b) additionally, a hat shape function of the receiving slit in the equatorial plane with a width of 0.1 mm has been convoluted into the profile; (c) additionally, an axial convolution with filament-, sample- and receiving-slit lengths of 8 mm each and a secondary Soller slit with an opening angle of 2.5° has been convoluted into the profile; (d) additionally a small contribution of Gaussian broadening coming from the position-sensitive detector is convoluted into the profile. [From Mittemeijer & Welzel (2012[link]). Copyright Wiley-VCH Verlag GmbH & Co. KGaA. Reproduced with permission.]