Tables for
Volume H
Powder diffraction
Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk

International Tables for Crystallography (2018). Vol. H, ch. 2.1, p. 35

Section Multiple-beam-path systems

A. Kerna*

aBruker AXS, Östliche Rheinbrückenstrasse 49, Karlsruhe 76187, Germany
Correspondence e-mail: Multiple-beam-path systems

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Multiple-beam-path systems are usually characterized by integrating more than one beam path on a single goniometer, employing different, complementary beam-path components to meet different application and specimen-property requirements. Mounting two different fixed-target X-ray sources (usually microsources) with different wavelengths (Cu, Mo) is very popular in single-crystal crystallography. Double detector arms are used to mount different types of detectors, most frequently one-dimensional detectors in combination with point detectors. Different X-ray optics can be used to implement different instrument geometries.

A significant driving force behind such multipurpose instrumentation is convenience, i.e. to serve a maximum range of applications and specimen types, ideally without the need to manually change the instrument configuration. Indeed, switching between different, preconfigured beam paths may often only require the push of a single software button. However, parallel mounting of different beam-path components raises issues related to the goniometer load and to limitations of angular scan ranges owing to collision issues.

In more recent designs, different X-ray optics have been combined into single motorized modules, allowing switching between different beam paths. Such `combi-optics' are described in Section[link].

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