Tables for
Volume H
Powder diffraction
Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk

International Tables for Crystallography (2018). Vol. H, ch. 2.1, p. 49

Section Dimensionality

A. Kerna*

aBruker AXS, Östliche Rheinbrückenstrasse 49, Karlsruhe 76187, Germany
Correspondence e-mail: Dimensionality

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Area detectors can be operated as line or point detectors. Electronic binning of the pixels into columns will form a line detector, while binning all pixels together will form a point detector, each associated with improvements of count rates and thus dynamic ranges. Alternatively, 1D or 0D `regions of interest' can be defined electronically and/or by mounting suitable diffracted-beam-path X-ray optics. Area detectors – when operated as such – require point-focus operation.

Line detectors can be used as point detectors, which may be formed in several ways. One way is to only use one or more central pixels by either electronically switching off outer pixels and/or by mounting suitable X-ray optics. Another way is to turn the detector by 90° and to bin all pixels, leading to an improved count rate and thus dynamic range.

Obviously, when turning a line detector by 90°, it will function as an area detector if it is scanned over an angular range; the trace of the scan will form a cylindrical surface that is a two-dimensional diffraction image (He, 2009[link]). This scan mode may be associated with a few advantages, in addition to lower costs. For example, the elimination of parallax and the possibility of using diffracted-beam-path optics improve the angular resolution in the 2θ direction and allow air scattering to be reduced.


He, B. B. (2009). Two-Dimensional X-ray Diffraction. New York: Wiley.Google Scholar

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