International
Tables for
Crystallography
Volume H
Powder diffraction
Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk

International Tables for Crystallography (2018). Vol. H, ch. 2.4, p. 106

Figure 2.4.4 

J.-M. Zuo,a* J. L. Lábár,b J. Zhang,c T. E. Gorelikd and U. Kolbe

aDepartment of Materials Science and Engineering, University of Illinois, 1304 W. Green Street, Urbana, IL 61801, USA,bInstitute of Technical Physics and Materials Science, Centre for Energy Research, Hungarian Academy of Sciences, Konkoly Thege M. u. 29–33, H-1121 Budapest, Hungary,cIntel Corporation, Technology Manufacturing Group, 2501 NE Century Boulevard, Hillsboro, OR 97124, USA,dUniversity of Ulm, Central Facility for Electron Microscopy, Electron Microscopy Group of Materials Science (EMMS), Albert Einstein Allee 11, 89069 Ulm, Germany, and eInstitut für Physikalische Chemie, Johannes Gutenberg-Universität Mainz, Welderweg 11, 55099 Mainz, Germany
Correspondence e-mail:  jianzuo@illinois.edu

[Figure 2.4.4]
Figure 2.4.4

Schematic illustration of electron nanoprobe formation using a combination of condenser lenses (II and III) and the objective lens. The beam divergence angle is kept at a minimum by forming a crossover at the front focal plane of the objective lens. An image of an experimental electron nanoprobe is shown on the right with a carbon nanotube contained inside the probe.