International
Tables for
Crystallography
Volume H
Powder diffraction
Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk

International Tables for Crystallography (2018). Vol. H, ch. 2.4, p. 106

Figure 2.4.5 

J.-M. Zuo,a* J. L. Lábár,b J. Zhang,c T. E. Gorelikd and U. Kolbe

aDepartment of Materials Science and Engineering, University of Illinois, 1304 W. Green Street, Urbana, IL 61801, USA,bInstitute of Technical Physics and Materials Science, Centre for Energy Research, Hungarian Academy of Sciences, Konkoly Thege M. u. 29–33, H-1121 Budapest, Hungary,cIntel Corporation, Technology Manufacturing Group, 2501 NE Century Boulevard, Hillsboro, OR 97124, USA,dUniversity of Ulm, Central Facility for Electron Microscopy, Electron Microscopy Group of Materials Science (EMMS), Albert Einstein Allee 11, 89069 Ulm, Germany, and eInstitut für Physikalische Chemie, Johannes Gutenberg-Universität Mainz, Welderweg 11, 55099 Mainz, Germany
Correspondence e-mail:  jianzuo@illinois.edu

[Figure 2.4.5]
Figure 2.4.5

Sample preparation and lift-out using a focused ion beam (FIB). A thin section of the sample is cut out using the FIB and attached to a mechanical probe for lift-out (inset). The image shows the lift-out section containing ZnO nanoparticles in bright dot-like contrast supported on an Si substrate.