International
Tables for
Crystallography
Volume H
Powder diffraction
Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk

International Tables for Crystallography (2018). Vol. H, ch. 2.5, pp. 124-125

Section 2.5.3.1.2. Liouville's theorem

B. B. Hea*

aBruker AXS Inc., 5465 E. Cheryl Parkway, Madison, WI 53711, USA
Correspondence e-mail: bob.he@bruker.com

2.5.3.1.2. Liouville's theorem

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Liouville's theorem can be used to describe the nature of the X-ray source, the X-ray optics and the coupling of the source and optics (Arndt, 1990[link]). Liouville's theorem can be stated in a variety of ways, but for X-ray optics the best known form is[{S_1}\alpha = {S_2}\beta, \eqno(2.5.14)]where S1 is the effective size of the X-ray source and α is the capture angle determined by the effective size of the X-ray optics and the distance between the source and optics. S2 is the size of the image focus. β is the convergence angle of the X-ray beam from the optics, which is also determined by the effective size of the X-ray optics and the distance between the optics and the image focus. The β angle is also called the crossfire of the X-ray beam. S2 and β are typically determined by experimental requirements such as beam size and divergence. Therefore, the product S1α is also determined by experimental conditions. In another expression of Liouville's theorem, the space volume containing the X-ray photons cannot be reduced with time along the trajectories of the system. Therefore, the brilliance of an X-ray source cannot be increased by optics, but may be reduced because of the loss of X-ray photons passing through the optics. In practice, no optics can have 100% reflectivity or transmission. Considering this, Liouville's theorem given in equation (2.5.14)[link] should be expressed as[{S_1}\alpha \le {S_2}\beta. \eqno(2.5.15)]This states that the product of the divergence and image size can be equal to or greater than the product of the capture angle and source size. If the X-ray source is a point with zero area, the focus image from focusing optics or the cross section of a parallel beam can be any chosen size. For focusing optics, the source size must be considerably smaller than the output beam size in order to achieve a gain in flux. In this case, the flux gain is from the increased capture angle. For parallel optics, the divergence angle β is infinitely small by definition, so it is necessary to use an X-ray source as small as possible to achieve a parallel beam. Focusing optics have an advantage over parallel optics in terms of beam flux. Using an X-ray beam with a divergence much smaller than the mosaicity of the specimen crystal does not improve the resolution, but does sacrifice diffraction intensity. For many X-ray diffraction applications with polycrystalline materials, a large crossfire is acceptable as long as the diffraction peaks concerned can be resolved. The improved peak profile and counting statistics can most often compensate for the peak broadening due to large crossfire.

References

Arndt, U. W. (1990). Focusing optics for laboratory sources in X-ray crystallography. J. Appl. Cryst. 23, 161–168.Google Scholar








































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