International
Tables for
Crystallography
Volume H
Powder diffraction
Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk

International Tables for Crystallography (2018). Vol. H, ch. 3.10, p. 378

Figure 3.10.4 

L. León-Reina,a A. Cuesta,b M. García-Maté,c,d G. Álvarez-Pinazo,c,d I. Santacruz,c O. Vallcorba,b A. G. De la Torrec and M. A. G. Arandab,c*

aServicios Centrales de Apoyo a la Investigación, Universidad de Málaga, 29071 Málaga, Spain,bALBA Synchrotron, Carrer de la Llum 2–26, Cerdanyola, 08290 Barcelona, Spain,cDepartamento de Química Inorgánica, Cristalografía y Mineralogía, Universidad de Málaga, 29071 Málaga, Spain, and dX-Ray Data Services S.L., Edificio de institutos universitarios, c/ Severo Ochoa 4, Parque tecnológico de Andalucía, 29590 Málaga, Spain
Correspondence e-mail:  g_aranda@uma.es

[Figure 3.10.4]
Figure 3.10.4

Selected region of the powder patterns showing the main diffraction peak of insoluble anhydrite for the low-content samples to investigate the limit of detection. Top left: Cu Kα1 pattern for CGpQ_0.12A. Middle left, Cu Kα1 pattern for CGpQ_0.25A. Bottom left, SXRPD pattern for CGpQ_0.12A. Top right, Mo Kα1 pattern for CGpQ_0.12A. Middle right, Mo Kα1 pattern for CGpQ_0.25A. Bottom right, Mo Kα1 pattern for CGpQ_0.50A. The main peak of anhydrite, (θ)/λ = 0.143 Å−1, is located at 25.4, 11.6 and 12.7° 2θ for Cu Kα1, Mo Kα1 and synchrotron radiations, respectively. The peak at sin(θ)/λ = 0.1445 Å−1 is due to the soluble anhydrite from gypsum (constant content in all the samples). The very tiny peak at sin(θ)/λ = 0.1457 Å−1, which is slightly visible only in the SXRPD pattern, arises from SrSO4 (0.39 wt%) from gypsum.