International
Tables for Crystallography Volume H Powder diffraction Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk © International Union of Crystallography 2018 |
International Tables for Crystallography (2018). Vol. H, ch. 3.9, p. 360
Figure 3.9.13a |
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Figure 3.9.13
Output of Rietveld refinement of XRD data (Cu Kα radiation) for a synthetic sample containing a mixture crystalline and amorphous phases. The observed data are represented as grey dots and the calculated pattern as the solid black line overlaying them. The broad peak centred at ∼22° 2θ is due to amorphous silica flour. The rows of tick marks at the bottom represent the positions of the Bragg reflections for quartz (upper) and corundum (lower). |