International
Tables for
Crystallography
Volume H
Powder diffraction
Edited by C. J. Gilmore, J. A. Kaduk and H. Schenk

© International Union of Crystallography 2018
International Tables for Crystallography (2018). Vol. H, ch. 3.9, p. 360

Figure 3.9.13 

I. C. Madsen,a* N. V. Y. Scarlett,a R. Kleebergb and K. Knorrc

aCSIRO Mineral Resources, Private Bag 10, Clayton South 3169, Victoria, Australia,bTU Bergakademie Freiberg, Institut für Mineralogie, Brennhausgasse 14, Freiberg, D-09596, Germany, and cBruker AXS GmbH, Oestliche Rheinbrückenstr. 49, 76187 Karlsruhe, Germany
Correspondence e-mail:  ian.madsen@csiro.au
[Figure 3.9.13]
Figure 3.9.13

Output of Rietveld refinement of XRD data (Cu Kα radiation) for a synthetic sample containing a mixture crystalline and amorphous phases. The observed data are represented as grey dots and the calculated pattern as the solid black line overlaying them. The broad peak centred at ∼22° 2θ is due to amorphous silica flour. The rows of tick marks at the bottom represent the positions of the Bragg reflections for quartz (upper) and corundum (lower).