International Tables for Crystallography


X-ray diffraction methods: polycrystalline
W. Parrish, A. J. C. Wilson and J. I. Langford. International Tables for Crystallography (2006). Vol. C, ch. 5.2, pp. 491-504  [ doi:10.1107/97809553602060000596 ]

Abstract

The determination of lattice parameters using X-ray powder methods is reviewed. Topics covered include: wavelength errors, refraction and statistical fluctuations; geometrical and physical aberrations; angle-dispersive diffractometer methods (using conventional and synchrotron sources); whole-pattern methods; energy-dispersive techniques; camera methods; testing for remanent systematic error; powder-diffraction, intensity and instrumental line-profile-shape standards; and factors determining accuracy.


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About International Tables for Crystallography

International Tables for Crystallography is the definitive resource and reference work for crystallography. The series consists of nine volumes and comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.