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Solid-state detectors
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 7.1.4.2, pp. 620-620 [ doi:10.1107/97809553602060000604 ]

     [more results from section 7.1.4 in volume C]

Proportional counters
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 7.1.3.2, pp. 619-619 [ doi:10.1107/97809553602060000604 ]

     [more results from section 7.1.3 in volume C]

Geiger counters
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 7.1.2, pp. 618-619 [ doi:10.1107/97809553602060000604 ]


Powder and related techniques: X-ray techniques
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, ch. 2.3, pp. 42-79 [ doi:10.1107/97809553602060000578 ]


Spectral purity
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.5.1.2, pp. 72-72 [ doi:10.1107/97809553602060000578 ]
& Parrish, 1959). The contaminating elements can be identified from the extra peaks. It is advisable to check the spectral purity when the tube is new and periodically thereafter. References Ladell, J. & Parrish, W. (1959 ...
     [more results from section 2.3.5 in volume C]

Use of peak or centroid for angle definition
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.3.3, pp. 63-63 [ doi:10.1107/97809553602060000578 ]
the Bragg equation becomes nonlinear in the sense that the 1:1 correspondence between λ and is lost. References Ladell, J., Parrish, W. & Taylor, J. (1959). Interpretation of diffractometer line profiles. Acta Cryst. 12 ...
     [more results from section 2.3.3 in volume C]

Powder cameras
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.4, pp. 70-71 [ doi:10.1107/97809553602060000578 ]
& Werner, P. E. (1973). Automatic densitometer measurement of powder diffraction photographs. Acta Chem. Scand. 27, 493–502. Google Scholar Parrish, W. (1955). Elimination of the second image in double-coated film. Norelco Rep. 2 ...
     [more results from section 2.3.4 in volume C]

Grazing-incidence diffraction
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.2.3, pp. 58-58 [ doi:10.1107/97809553602060000578 ]
intensity is an order of magnitude lower than (a). References Lim, G., Parrish, W., Ortiz, C., Bellotto, M. & Hart, M. (1987). Grazing incidence synchrotron X-ray diffraction method for analyzing thin films. J. Mater ...
     [more results from section 2.3.2 in volume C]

Combined aberrations
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.1.1.8, pp. 50-50 [ doi:10.1107/97809553602060000578 ]

     [more results from section 2.3.1 in volume C]

X-ray diffraction methods: polycrystalline
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, ch. 5.2, pp. 491-504 [ doi:10.1107/97809553602060000596 ]
J. Cryst. Growth, 55, 409–427. Google Scholar Hart, M., Cernik, R., Parrish, W. & Toraya, H. (1990). Lattice parameter determination for powders using synchrotron radiation. J. Appl. Cryst. 23, 286–291. Google Scholar ...

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