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 Results for by Langford, J. I.   page 1 of 4 pages.
Solid-state detectors
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 7.1.4.2, pp. 620-620 [ doi:10.1107/97809553602060000604 ]

     [more results from section 7.1.4 in volume C]

Proportional counters
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 7.1.3.2, pp. 619-619 [ doi:10.1107/97809553602060000604 ]

     [more results from section 7.1.3 in volume C]

Geiger counters
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 7.1.2, pp. 618-619 [ doi:10.1107/97809553602060000604 ]


Powder and related techniques: X-ray techniques
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, ch. 2.3, pp. 42-79 [ doi:10.1107/97809553602060000578 ]


Spectral purity
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.5.1.2, pp. 72-72 [ doi:10.1107/97809553602060000578 ]

     [more results from section 2.3.5 in volume C]

Use of peak or centroid for angle definition
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.3.3, pp. 63-63 [ doi:10.1107/97809553602060000578 ]
561–567. Google Scholar Langford, J. I. (1982). The variance as a measure of line broadening: corrections for truncation, curvature and instrument effects. J. Appl. Cryst. 15, 315–322. Google Scholar Taylor, J., Mack, M ...
     [more results from section 2.3.3 in volume C]

Powder cameras
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.4, pp. 70-71 [ doi:10.1107/97809553602060000578 ]

     [more results from section 2.3.4 in volume C]

Grazing-incidence diffraction
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.2.3, pp. 58-58 [ doi:10.1107/97809553602060000578 ]

     [more results from section 2.3.2 in volume C]

Combined aberrations
Parrish, W. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 2.3.1.1.8, pp. 50-50 [ doi:10.1107/97809553602060000578 ]

     [more results from section 2.3.1 in volume C]

X-ray diffraction methods: polycrystalline
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, ch. 5.2, pp. 491-504 [ doi:10.1107/97809553602060000596 ]
analysis. J. Appl. Cryst. 3, 165–171. Google Scholar Fawcett, T. G., Crowder, C. E., Brownell, S. J., Zhang, Y., Hubbard, C., Schreiner, W., Hamill, G. P., Huang, T. C., Sabino, E., Langford, J. I., Hamilton, R. & Louër, D. (1988 ...

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