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Electron powder diffraction
Zuo, J.-M., Lábár, J. L., Zhang, J., Gorelik, T. E. and Kolb, U.  International Tables for Crystallography (2018). Vol. H, ch. 2.4, pp. 102-117 [ doi:10.1107/97809553602060000939 ]
Electron powder diffraction Electron powder diffraction patterns can be recorded from small volumes of nanoparticles or localized areas of nanocrystalline thin films, which makes electron diffraction a complementary technique to X-ray and neutron powder diffraction for challenging samples. This chapter covers electron diffraction techniques for powder diffraction data collection and ...

Summary
Zuo, J.-M., Lábár, J. L., Zhang, J., Gorelik, T. E. and Kolb, U.  International Tables for Crystallography (2018). Vol. H, Section 2.4.8, p. 114 [ doi:10.1107/97809553602060000939 ]
Summary 2.4.8. Summary Powder electron diffraction can be used for materials structural characterization, just as is routinely done using X-rays and neutrons. The specific characteristics of electron scattering result in both benefits and drawbacks to using electron diffraction data. Strong scattering of electrons allows collection of a sufficient signal from ...

The pair distribution function from electron diffraction data
Gorelik, T. E. and Kolb, U.  International Tables for Crystallography (2018). Vol. H, Section 2.4.7, pp. 113-114 [ doi:10.1107/97809553602060000939 ]
... M. C. D., Malliakas, C. D., Juhás, P., Bozin, E. S., Kanatzidis, M. G. & Billinge, S. J. L. (2012). ... electron scattering. Annu. Rev. Mater. Res. 37, 159-187.GoogleScholar Egami, T. & Billinge, S. J. L. (2003). Underneath the Bragg Peaks ... Acta Cryst. A65, 232-239.GoogleScholar Hirata, A., Hirotsu, Y., Ohkubo, T., Hanada, T. & Bengus, V. Z. (2006). Compositional dependence ...

Rietveld refinement with electron diffraction data
Gorelik, T. E. and Kolb, U.  International Tables for Crystallography (2018). Vol. H, Section 2.4.6, pp. 111-113 [ doi:10.1107/97809553602060000939 ]
... instrumental parameters needs further systematic study. References Burdett, J. K. T., Hughbanks, T., Miller, G. J., Richardson, J. W. & Smith, J. V. (1987 ... J., Fischer, J., Merlini, M., Poli, S., Fumagalli, P., Mugnaioli, E. & Kolb, U. (2011). A new hydrous Al-bearing ...

Introduction
Zuo, J.-M., Lábár, J. L., Zhang, J., Gorelik, T. E. and Kolb, U.  International Tables for Crystallography (2018). Vol. H, Section 2.4.1, pp. 102-103 [ doi:10.1107/97809553602060000939 ]
... Tanaka, 1999 ; Hovmoller et al., 2002 ; Sun et al., 2009 ; Gorelik et al., 2010 ; Mugnaioli et al., 2012 ), or in combination ... Monographs on Crystallography. Oxford: IUCr/Oxford University Press.GoogleScholar Elsayedali, H. E. & Herman, J. W. (1990). Ultrahigh vacuum picosecond laser-driven ... the [001] projection of AlmFe. Acta Cryst. A54, 102-119.GoogleScholar Gorelik, T., Matveeva, G., Kolb, U., Schleuss, T., Kilbinger, A. ...

Electron powder diffraction
Zuo, J.-M., Lábár, J. L., Zhang, J., Gorelik, T. E. and Kolb, U.  International Tables for Crystallography (2018). Vol. H, ch. 2.4, pp. 102-117 [ doi:10.1107/97809553602060000939 ]
... Tanaka, 1999 ; Hovmoller et al., 2002 ; Sun et al., 2009 ; Gorelik et al., 2010 ; Mugnaioli et al., 2012 ), or in combination ... is the electron structure factor of the hkl reflection: Here T is the atomic displacement factor, which accounts for atomic thermal vibrations, and the electron atomic scattering factor fi e is defined by equation (4.3.1.13) in International Tables for ...

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