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 Results for DC.creator="B." AND DC.creator="Buras" in section 2.5.1 of volume C
Techniques for X-rays
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1, pp. 84-87 [ doi:10.1107/97809553602060000580 ]
... diffraction, XED, invented in the late sixties (Giessen & Gordon, 1968; Buras, Chwaszczewska, Szarras & Szmid 1968), utilizes a primary X-ray beam ... due to the Ge detector are denoted by e (from Buras, Gerward, Glazer, Hidaka & Olsen, 1979). (b) The scattering angle is fixed during the measurement but ...

Single-crystal diffraction
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1.7, p. 86 [ doi:10.1107/97809553602060000580 ]
... method. Adaptations to energy-dispersive work have been made by Buras, Olsen, Gerward, Selsmark & Lindegaard-Andersen (1975). References Buras, B., Olsen, J. S., Gerward, L., Selsmark, B. & Lindegaard-Andersen, ...

The Rietveld method
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1.6, p. 86 [ doi:10.1107/97809553602060000580 ]
... low-resolution technique, such as XED (Glazer, Hidaka & Bordas, 1978; Buras, Gerward, Glazer, Hidaka & Olsen, 1979; Neuling & Holzapfel, 1992). In ... where U and V are the half-width parameters. References Buras, B., Gerward, L., Glazer, A. M., Hidaka, M. & Olsen, J. ...

Corrections
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1.5, p. 86 [ doi:10.1107/97809553602060000580 ]
... constants of the sample are known (Uno & Ishigaki 1975). (b) Absorption. The transmission factor ) for a small sample bathed in ...

Integrated intensity for powder sample
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1.4, pp. 85-86 [ doi:10.1107/97809553602060000580 ]
... Bragg reflection of a powder sample can then be written (Buras & Gerward, 1975; Kalman, 1979) where h is the diffraction vector ... is correct to within 2.5% for all photon energies (Olsen, Buras, Jensen, Alstrup, Gerward & Selsmark, 1978). Equations (2.5.1.6b) and (2.5.1.6c ... or assumed structure than for a full structure determination. References Buras, B. & Gerward, L. (1975). Relations between integrated intensities ...

Resolution
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1.3, p. 85 [ doi:10.1107/97809553602060000580 ]
... sample and other experimental conditions (cf. Fukamachi, Hosoya & Terasaki, 1973; Buras, Niimura & Olsen, 1978). Figure 2.5.1.3 | | Relative resolution, , as function ... two values of the lattice plane spacing: (a) 1Å and (b) 0.5Å. The full curves have been calculated for , the ... diffraction using synchrotron radiation. J. Appl. Cryst. 11, 684-687. Buras, B., Niimura, N. & Olsen, J. S. (1978). Optimum ...

Incident X-ray beam
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1.2, p. 84 [ doi:10.1107/97809553602060000580 ]
... tube. Also, the polarization is difficult to measure or calculate. (b) Synchrotron radiation. Synchrotron radiation emitted by electrons or positrons, when ...

Recording of powder diffraction spectra
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1.1, p. 84 [ doi:10.1107/97809553602060000580 ]
... due to the Ge detector are denoted by e (from Buras, Gerward, Glazer, Hidaka & Olsen, 1979). (b) The scattering angle is fixed during the measurement but can ... small samples (Holzapfel & May, 1982; Häusermann, 1992). References Buras, B., Gerward, L., Glazer, A. M., Hidaka, M. & Olsen, ...

Applications
Buras, B. and Gerward, L.  International Tables for Crystallography (2006). Vol. C, Section 2.5.1.8, pp. 86-87 [ doi:10.1107/97809553602060000580 ]
... 10-3-10-5mm3). Reviews have been given by Buras & Gerward (1989) and Häusermann (1992). Recently, XED experiments ... powder averaging (Nelmes & McMahon, 1994, and references therein). References Buras, B. & Gerward, L. (1989). Application of X-ray energy- ...

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