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Results for DC.creator="J." AND DC.creator="M." AND DC.creator="Cowley" in section 2.4.1 of volume C |
Unknown-phase identification: databases
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.6, pp. 81-82 [ doi:10.1107/97809553602060000579 ]
... G. W. Bailey, pp. 444-445. Baton Rouge: Claitors. Carr, M. J., Chambers, W. F., Melgaard, D. K., Himes, V. L., Stalick, J. K. & Mighell, A. D. (1987). NBS/Sandia/ICDD ...
Crystal-size analysis
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.5, p. 81 [ doi:10.1107/97809553602060000579 ]
... strongly dependent on the crystallographic planes involved (Sturkey & Frevel, 1945; Cowley & Rees, 1947; Honjo & Mihama, 1954). For more isometric crystal ... dependence is less marked and the broadening has been estimated (Cowley & Rees, 1947) as equivalent to that due to a particle size of about 200Å. References Cowley, J. M. & Rees, A. L. G. (1947). Refraction ...
Powder-pattern intensities
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.4, pp. 80-81 [ doi:10.1107/97809553602060000579 ]
... the unit-cell volume, V is the sample volume, and M is the multiplicity factor. The kinematical approximation has limited validity. ... of strong preferred orientations. It was shown theoretically by Turner & Cowley (1969) and experimentally by Imamov, Pannhorst, Avilov & Pinsker (1976) that ... Avilov, A. S., Parmon, V. S., Semiletov, S. A. & Sirota, M. I. (1984). Intensity calculations for many-wave diffraction ...
Electron techniques
International Tables for Crystallography (2006). Vol. C, Section 2.4.1, pp. 80-82 [ doi:10.1107/97809553602060000579 ]
... the unit-cell volume, V is the sample volume, and M is the multiplicity factor. The kinematical approximation has limited validity. ... of strong preferred orientations. It was shown theoretically by Turner & Cowley (1969) and experimentally by Imamov, Pannhorst, Avilov & Pinsker (1976) that ... strongly dependent on the crystallographic planes involved (Sturkey & Frevel, 1945; Cowley & Rees, 1947; Honjo & Mihama, 1954). For more isometric ...
Diffraction patterns in electron microscopes
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.2, p. 80 [ doi:10.1107/97809553602060000579 ]
Diffraction patterns in electron microscopes 2.4.1.2. Diffraction patterns in electron microscopes The specimens used in electron microscopes may be self-supporting thin films or fine powders supported on thin films, usually made of amorphous carbon. Specimen thicknesses must be less than about 103Å in order to avoid perturbations of the diffraction ...
Powder-pattern geometry
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.1, p. 80 [ doi:10.1107/97809553602060000579 ]
Powder-pattern geometry 2.4.1.1. Powder-pattern geometry The electron wavelengths normally used to obtain powder patterns from thin films of polycrystalline materials lie in the range 8 × 10-2 to 2 × 10-2Å (20 to 200kV accelerating voltages). The maximum scattering angles () observed are usually less than 10-1rad. Patterns ...
Preferred orientations
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.3, p. 80 [ doi:10.1107/97809553602060000579 ]
Preferred orientations 2.4.1.3. Preferred orientations The techniques of specimen preparation may result in a strong preferred orientation of the crystallites, resulting in strong arcing of powder-pattern rings, the absence of some rings, and perturbations of relative intensities. For example, small crystals of flaky habit deposited on a flat supporting film ...
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.6, pp. 81-82 [ doi:10.1107/97809553602060000579 ]
... G. W. Bailey, pp. 444-445. Baton Rouge: Claitors. Carr, M. J., Chambers, W. F., Melgaard, D. K., Himes, V. L., Stalick, J. K. & Mighell, A. D. (1987). NBS/Sandia/ICDD ...
Crystal-size analysis
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.5, p. 81 [ doi:10.1107/97809553602060000579 ]
... strongly dependent on the crystallographic planes involved (Sturkey & Frevel, 1945; Cowley & Rees, 1947; Honjo & Mihama, 1954). For more isometric crystal ... dependence is less marked and the broadening has been estimated (Cowley & Rees, 1947) as equivalent to that due to a particle size of about 200Å. References Cowley, J. M. & Rees, A. L. G. (1947). Refraction ...
Powder-pattern intensities
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.4, pp. 80-81 [ doi:10.1107/97809553602060000579 ]
... the unit-cell volume, V is the sample volume, and M is the multiplicity factor. The kinematical approximation has limited validity. ... of strong preferred orientations. It was shown theoretically by Turner & Cowley (1969) and experimentally by Imamov, Pannhorst, Avilov & Pinsker (1976) that ... Avilov, A. S., Parmon, V. S., Semiletov, S. A. & Sirota, M. I. (1984). Intensity calculations for many-wave diffraction ...
Electron techniques
International Tables for Crystallography (2006). Vol. C, Section 2.4.1, pp. 80-82 [ doi:10.1107/97809553602060000579 ]
... the unit-cell volume, V is the sample volume, and M is the multiplicity factor. The kinematical approximation has limited validity. ... of strong preferred orientations. It was shown theoretically by Turner & Cowley (1969) and experimentally by Imamov, Pannhorst, Avilov & Pinsker (1976) that ... strongly dependent on the crystallographic planes involved (Sturkey & Frevel, 1945; Cowley & Rees, 1947; Honjo & Mihama, 1954). For more isometric ...
Diffraction patterns in electron microscopes
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.2, p. 80 [ doi:10.1107/97809553602060000579 ]
Diffraction patterns in electron microscopes 2.4.1.2. Diffraction patterns in electron microscopes The specimens used in electron microscopes may be self-supporting thin films or fine powders supported on thin films, usually made of amorphous carbon. Specimen thicknesses must be less than about 103Å in order to avoid perturbations of the diffraction ...
Powder-pattern geometry
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.1, p. 80 [ doi:10.1107/97809553602060000579 ]
Powder-pattern geometry 2.4.1.1. Powder-pattern geometry The electron wavelengths normally used to obtain powder patterns from thin films of polycrystalline materials lie in the range 8 × 10-2 to 2 × 10-2Å (20 to 200kV accelerating voltages). The maximum scattering angles () observed are usually less than 10-1rad. Patterns ...
Preferred orientations
International Tables for Crystallography (2006). Vol. C, Section 2.4.1.3, p. 80 [ doi:10.1107/97809553602060000579 ]
Preferred orientations 2.4.1.3. Preferred orientations The techniques of specimen preparation may result in a strong preferred orientation of the crystallites, resulting in strong arcing of powder-pattern rings, the absence of some rings, and perturbations of relative intensities. For example, small crystals of flaky habit deposited on a flat supporting film ...
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