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Camera methods
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.8, pp. 497-498 [ doi:10.1107/97809553602060000596 ]
Camera methods 5.2.8. Camera methods The types of powder camera frequently used in the determination of lattice parameters are described in Section 2.3.4 . The main geometrical aberrations affecting measurements made with them are summarized in Table 5.2.8.1. At high angles, most of them vary approximately as ([pi] - 2[theta])2 ...

Energy-dispersive techniques
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.7, pp. 496-497 [ doi:10.1107/97809553602060000596 ]
... scanned to select a gradually increasing (or decreasing) single wavelength (Parrish & Hart, 1987). This method permits much higher count rates ... irradiated volume and the specimen transparency (Langford & Wilson, 1962; Mantler & Parrish, 1977). As Sparks & Gedcke (1972)1 emphasize, spacing measurements ... Olsen, Gerward, Will & Hinze (1977), Fukamachi, Hosoya & Terasaki (1973), Laguitton & Parrish (1977) and Wilson (1973). Only the last of ...

Whole-pattern methods
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.6, p. 496 [ doi:10.1107/97809553602060000596 ]
... The reflections may be fitted individually or in small clusters (Parrish & Huang, 1980) or the whole pattern can be fitted (Pawley ... be obtained using selected peaks rather than the whole pattern (Parrish & Huang, 1980). Peak search or profile fitting is used ... J. I., Lour, D., Sonneveld, E. J. & Visser, J. W. (1986). Applications of total pattern fitting to a ...

Angle-dispersive diffractometer methods: synchrotron sources
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.5, pp. 495-496 [ doi:10.1107/97809553602060000596 ]
... synchrotron radiation has a number of advantages over focusing methods (Parrish, Hart, Huang & Bellotto, 1987; Parrish, 1988; Huang, 1988). The -doublet problem does not arise ... an accurately known standard measured with the same experimental conditions (Parrish et al., 1987). The standard may be mixed ...

Angle-dispersive diffractometer methods: conventional sources
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.4, p. 495 [ doi:10.1107/97809553602060000596 ]
... Angle-dispersive diffractometer methods: conventional sources The symmetrical Bragg-Brentano (Parrish) and the Seemann-Bohlin angle-dispersive diffractometers are fully described ... the Seemann-Bohlin aberrations containing R become very large. Mack & Parrish (1967) have confirmed experimentally the expected differences in favour of ... . Table 5.2.4.1| | Centroid displacement <[Delta][theta]/[theta]> and variance W of certain aberrations of an angle-dispersive diffractometer; for ...

Extrapolation, graphical and analytical
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.3.2, pp. 493-494 [ doi:10.1107/97809553602060000596 ]
... Appl. Cryst. 4, 498-506. Gillham, C. J. & King, H. W. (1972). Measurements of centroid and peak shifts due to ...
     [more results from section 5.2.3 in volume C]

Statistical fluctuations
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.2.3, pp. 492-493 [ doi:10.1107/97809553602060000596 ]
Statistical fluctuations 5.2.2.3. Statistical fluctuations Statistical fluctuations in the number of counts recorded are not aberrations, but random errors. They influence the precision with which the angles of diffraction, and hence the lattice parameters, can be determined. The fluctuations arise from at least two sources: emission of X-ray quanta from ...
     [more results from section 5.2.2 in volume C]

Bragg angle: operational definitions
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.1.4, pp. 491-492 [ doi:10.1107/97809553602060000596 ]
... descriptions are given in Section 2.3.4 . For Bragg-Brentano (Parrish) and Seemann-Bohlin diffractometers, rate-meter measurements with strip-chart ...
     [more results from section 5.2.1 in volume C]

X-ray diffraction methods: polycrystalline
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, ch. 5.2, pp. 491-504 [ doi:10.1107/97809553602060000596 ]
... descriptions are given in Section 2.3.4 . For Bragg-Brentano (Parrish) and Seemann-Bohlin diffractometers, rate-meter measurements with strip-chart ... rather than a displacement (Wilson, 1940, 1962; Wilkens, 1960; Hart, Parrish, Bellotto & Lim, 1988; Greenberg, 1989). The greater wavelength within ... Spencer, 1931, 1935, 1937, 1939, 1941, 1949; Wilson, 1950; Ladell, Parrish & Taylor, 1959; Pike & Wilson, 1959). It is all ...

Single and balanced filters
Parrish, W. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 2.3.5.4.2, pp. 78-79 [ doi:10.1107/97809553602060000578 ]
... example, an Ni filter is an ideal absorber for the W L spectrum. The filter thickness required to obtain a certain ... common targets. A brass filter has been used to isolate W . The L-absorption edges of high atomic number elements ...
     [more results from section 2.3.5 in volume C]

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