Solid-state detectors
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 7.1.4.2,
pp. 620-620
[ doi:10.1107/97809553602060000604 ]
[
more
results from section 7.1.4 in volume C]
Proportional counters
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 7.1.3.2,
pp. 619-619
[ doi:10.1107/97809553602060000604 ]
[
more
results from section 7.1.3 in volume C]
Geiger counters
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 7.1.2,
pp. 618-619
[ doi:10.1107/97809553602060000604 ]
Powder and related techniques: X-ray techniques
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
ch. 2.3,
pp. 42-79
[ doi:10.1107/97809553602060000578 ]
Spectral purity
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.5.1.2,
pp. 72-72
[ doi:10.1107/97809553602060000578 ]
[
more
results from section 2.3.5 in volume C]
Use of peak or centroid for angle definition
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.3.3,
pp. 63-63
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Powder cameras
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.4,
pp. 70-71
[ doi:10.1107/97809553602060000578 ]
[
more
results from section 2.3.4 in volume C]
Grazing-incidence diffraction
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.2.3,
pp. 58-58
[ doi:10.1107/97809553602060000578 ]
[
more
results from section 2.3.2 in volume C]
Combined aberrations
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.1.1.8,
pp. 50-50
[ doi:10.1107/97809553602060000578 ]
[
more
results from section 2.3.1 in volume C]
X-ray diffraction methods: polycrystalline
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
ch. 5.2,
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